Top Headlines

• Jul 1, 2010 - The New York Forum: A Call to Action
  On June 22nd 2010, Richard Attias, executive chairman at The Experience Corporation lead the New York Forum which gathered world financial leaders, top CEOs, and policy makers for "a series of spirited discussions, debates and dialogues, with a mission that is both bold and urgent: to reinvent business models, to stimulate job creation and restore faith in the international economy." Among the participants at the New York Forum were Carlos Slim, telecom tycoon and the wealthiest man in the world, Rupert Murdoch, Chairman and CEO of News Corp, Michael Bloomberg, mayor of New York City and many... Read More
• Jun 9, 2010 - Anvato recognized at Frost & Sullivan Excellence in Best Practices banquet
  Mountain View, Calif. June 09, 2010- Frost & Sullivan honored recipients of its 2010 Excellence in Best Practices Awards, at a banquet held on Tuesday, June 8, 2010 in Anaheim, California. Frost & Sullivan's Best Practices Awards recognize companies in a variety of regional and global markets for demonstrating outstanding achievement and superior performance in areas such as leadership, technological innovation, customer service, and strategic product development. Industry analysts compare market participants and measure performance through in-depth interviews, analysis, and extensive secondary research in order to identify best practices. The Best Practices Awards Banquet was co-located with Frost & Sullivan's 6th Annual Global Innovations in New Product Development 2010: A Frost & Sullivan Executive MindXchange, held June 6-8, 2010... Read More
• May 18, 2010 - RF Nano Corporation Patents Contactless Scanning Nanotube Probe
  Newport Beach, CA, May 18,2010 - RFnano received U.S. Patent 7,721,347 for a scanning nanotube probe device and its method of operation. According to inventor Peter J. Burke, a Professor of Electrical Engineering at the University of California-Irvine, the device provides a method of determining, without contact, the physical and electrical properties of nanotube materials.... Read More